Change of lattice distortion images in X-ray topography with resonant scattering in the Laue case
Plane-wave topographs of X-rays for the GaAs 200 reflection were recorded using synchrotron radiation near the K-absorption edges of Ga and As. The topographic contrasts caused by lattice defects were changed by tuning the X-ray energy to four typical resonant scattering conditions. A sharp image of...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1998. - 11(2004), Pt 3 vom: 01. Mai, Seite 266-71 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2004
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |