Soft X-ray resonant magnetic scattering from a Ni layer with modulated magnetic anisotropy

Soft X-ray resonant magnetic scattering studies on a magnetically modulated, but nominally chemically homogenous, 5 nm Ni layer in a Cu/Ni/Cu/Co/NiO/GaAs(110) system are reported. It was possible to estimate the main chemical structure of the sample on the basis of the results from specular reflecti...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 11(2004), Pt 3 vom: 01. Mai, Seite 254-60
Auteur principal: Haznar, A (Auteur)
Autres auteurs: van der Laan, G, Collins, S P, Vaz, C A F, Bland, J A C, Dhesi, S S
Format: Article
Langue:English
Publié: 2004
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article