Optimization of an ultra low-phase noise sapphire--SiGe HBT oscillator using nonlinear CAD

In this paper, the electrical and noise performances of a 0.8 microm silicon germanium (SiGe) transistor optimized for the design of low phase-noise circuits are described. A nonlinear model developed for the transistor and its use for the design of a low-phase noise C band sapphire resonator oscill...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1999. - 51(2004), 1 vom: 14. Jan., Seite 33-41
1. Verfasser: Cibiel, Gilles (VerfasserIn)
Weitere Verfasser: Régis, Myrianne, Llopis, Olivier, Rennane, Abdelali, Bary, Laurent, Plana, Robert, Kersalé, Yann, Giordano, Vincent
Format: Aufsatz
Sprache:English
Veröffentlicht: 2004
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Journal Article
LEADER 01000caa a22002652 4500
001 NLM146964616
003 DE-627
005 20250205100917.0
007 tu
008 231223s2004 xx ||||| 00| ||eng c
028 5 2 |a pubmed25n0490.xml 
035 |a (DE-627)NLM146964616 
035 |a (NLM)14995014 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Cibiel, Gilles  |e verfasserin  |4 aut 
245 1 0 |a Optimization of an ultra low-phase noise sapphire--SiGe HBT oscillator using nonlinear CAD 
264 1 |c 2004 
336 |a Text  |b txt  |2 rdacontent 
337 |a ohne Hilfsmittel zu benutzen  |b n  |2 rdamedia 
338 |a Band  |b nc  |2 rdacarrier 
500 |a Date Completed 28.04.2004 
500 |a Date Revised 17.09.2019 
500 |a published: Print 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a In this paper, the electrical and noise performances of a 0.8 microm silicon germanium (SiGe) transistor optimized for the design of low phase-noise circuits are described. A nonlinear model developed for the transistor and its use for the design of a low-phase noise C band sapphire resonator oscillator are also reported. The best measured phase noise (at ambient temperature) is -138 dBc/Hz at 1 kHz offset from a 4.85 GHz carrier frequency, with a loaded QL factor of 75,000 
650 4 |a Journal Article 
700 1 |a Régis, Myrianne  |e verfasserin  |4 aut 
700 1 |a Llopis, Olivier  |e verfasserin  |4 aut 
700 1 |a Rennane, Abdelali  |e verfasserin  |4 aut 
700 1 |a Bary, Laurent  |e verfasserin  |4 aut 
700 1 |a Plana, Robert  |e verfasserin  |4 aut 
700 1 |a Kersalé, Yann  |e verfasserin  |4 aut 
700 1 |a Giordano, Vincent  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t IEEE transactions on ultrasonics, ferroelectrics, and frequency control  |d 1999  |g 51(2004), 1 vom: 14. Jan., Seite 33-41  |w (DE-627)NLM098181017  |x 0885-3010  |7 nnns 
773 1 8 |g volume:51  |g year:2004  |g number:1  |g day:14  |g month:01  |g pages:33-41 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_22 
912 |a GBV_ILN_24 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 51  |j 2004  |e 1  |b 14  |c 01  |h 33-41