High-resolution and high-intensity powder diffractometer at BL15XU in SPring-8

A new ultra-high-resolution powder diffractometer for synchrotron radiation has been constructed at beamline BL15XU, SPring-8. The two-axis diffractometer is optimized for high-flux and high-coherent X-ray beams, which are provided by combining a planar undulator and a large offset rotated-inclined...

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Veröffentlicht in:Journal of synchrotron radiation. - 1998. - 10(2003), Pt 6 vom: 01. Nov., Seite 424-9
1. Verfasser: Ikeda, Takuji (VerfasserIn)
Weitere Verfasser: Nisawa, Atsushi, Okui, Masato, Yagi, Nobuhiro, Yoshikawa, Hideki, Fukushima, Sei
Format: Aufsatz
Sprache:English
Veröffentlicht: 2003
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Comparative Study Evaluation Study Journal Article Validation Study Zeolites 1318-02-1
LEADER 01000caa a22002652 4500
001 NLM142775800
003 DE-627
005 20250205020541.0
007 tu
008 231223s2003 xx ||||| 00| ||eng c
028 5 2 |a pubmed25n0476.xml 
035 |a (DE-627)NLM142775800 
035 |a (NLM)14551442 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Ikeda, Takuji  |e verfasserin  |4 aut 
245 1 0 |a High-resolution and high-intensity powder diffractometer at BL15XU in SPring-8 
264 1 |c 2003 
336 |a Text  |b txt  |2 rdacontent 
337 |a ohne Hilfsmittel zu benutzen  |b n  |2 rdamedia 
338 |a Band  |b nc  |2 rdacarrier 
500 |a Date Completed 20.01.2004 
500 |a Date Revised 10.12.2019 
500 |a published: Print-Electronic 
500 |a Citation Status MEDLINE 
520 |a A new ultra-high-resolution powder diffractometer for synchrotron radiation has been constructed at beamline BL15XU, SPring-8. The two-axis diffractometer is optimized for high-flux and high-coherent X-ray beams, which are provided by combining a planar undulator and a large offset rotated-inclined Si(111) double-crystal monochromator. The optics design of the diffractometer is based on transmission geometry, which employs a capillary specimen and reflection geometries using a flat-plate specimen. The intensity data are collected using a 2theta step-scan technique in both geometries. The diffractometer can be arranged in a variety of optical configurations, e.g. simple receiving slits, flat crystal analyzer of Ge(111) or Si(111), and in-vacuum-type long horizontal parallel slits. A minimum full width at half-maximum against 2theta was 0.00572 degrees at lambda = 0.63582 A for the (200) reflections from Si powder in the transmission geometry employing the Ge(111) crystal analyzer. A wide temperature range (32-900 K), which is controlled by a He/N(2) gas stream system, is available. 288 structure parameters of a zeolite ZSM-5 sample have been demonstrated to successfully refine with a R(wp) value of 6.96% by a Rietveld analysis of the high-resolution powder diffraction data from a 1 mm-diameter capillary specimen 
650 4 |a Comparative Study 
650 4 |a Evaluation Study 
650 4 |a Journal Article 
650 4 |a Validation Study 
650 7 |a Zeolites  |2 NLM 
650 7 |a 1318-02-1  |2 NLM 
700 1 |a Nisawa, Atsushi  |e verfasserin  |4 aut 
700 1 |a Okui, Masato  |e verfasserin  |4 aut 
700 1 |a Yagi, Nobuhiro  |e verfasserin  |4 aut 
700 1 |a Yoshikawa, Hideki  |e verfasserin  |4 aut 
700 1 |a Fukushima, Sei  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Journal of synchrotron radiation  |d 1998  |g 10(2003), Pt 6 vom: 01. Nov., Seite 424-9  |w (DE-627)NLM09824129X  |x 0909-0495  |7 nnns 
773 1 8 |g volume:10  |g year:2003  |g number:Pt 6  |g day:01  |g month:11  |g pages:424-9 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_40 
912 |a GBV_ILN_350 
912 |a GBV_ILN_2005 
951 |a AR 
952 |d 10  |j 2003  |e Pt 6  |b 01  |c 11  |h 424-9