Counting statistics of X-ray detectors at high counting rates
Modern synchrotron radiation sources with insertion devices and focusing optics produce high fluxes of X-rays at the sample, which leads to a requirement for photon-counting detectors to operate at high counting rates. With high counting rates there can be significant non-linearity in the response o...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1999. - 10(2003), Pt 3 vom: 01. Mai, Seite 214-8 |
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| Format: | Aufsatz |
| Sprache: | English |
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2003
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |
| Zusammenfassung: | Modern synchrotron radiation sources with insertion devices and focusing optics produce high fluxes of X-rays at the sample, which leads to a requirement for photon-counting detectors to operate at high counting rates. With high counting rates there can be significant non-linearity in the response of the detector to incident X-ray flux, where this non-linearity is caused by the overlap of the electronic pulses that are produced by each X-ray. A model that describes the overlap of detector pulses is developed in this paper. This model predicts that the correction to the counting rate for pulse overlap is the same as a conventional dead-time correction. The model is also used to calculate the statistical uncertainty of a measurement and predicts that the error associated with a measurement can be increased significantly over that predicted by Poisson (N(-1/2)) statistics. The error differs from that predicted by a conventional dead-time treatment |
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| Beschreibung: | Date Completed 02.10.2003 Date Revised 05.06.2019 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 0909-0495 |