Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis
A silicon drift detector (SDD) was used for ex situ and time-resolved in situ fluorescence X-ray absorption fine structure (XAFS) on low-concentrated catalyst samples. For a single-element and a seven-element SDD the energy resolution and the peak-to-background ratio were verified at high count rate...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 9(2002), Pt 4 vom: 01. Juli, Seite 246-53 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2002
|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |