Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis
A silicon drift detector (SDD) was used for ex situ and time-resolved in situ fluorescence X-ray absorption fine structure (XAFS) on low-concentrated catalyst samples. For a single-element and a seven-element SDD the energy resolution and the peak-to-background ratio were verified at high count rate...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 9(2002), Pt 4 vom: 01. Juli, Seite 246-53 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2002
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |