Style de citation APA

Korsunsky, A. M., Collins, S. P., Owen, R. A., Daymond, M. R., Achtioui, S., & James, K. E. (2002). Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS. Journal of synchrotron radiation, 9(Pt 2), 77.

Style de citation Chicago

Korsunsky, Alexander M., Steve P. Collins, R Alexander Owen, Mark R. Daymond, Saïda Achtioui, et Karen E. James. "Fast Residual Stress Mapping Using Energy-dispersive Synchrotron X-ray Diffraction on Station 16.3 at the SRS." Journal of Synchrotron Radiation 9, no. Pt 2 (2002): 77.

Style de citation MLA

Korsunsky, Alexander M., et al. "Fast Residual Stress Mapping Using Energy-dispersive Synchrotron X-ray Diffraction on Station 16.3 at the SRS." Journal of Synchrotron Radiation, vol. 9, no. Pt 2, 2002, p. 77.