Local structure of Ge nanocrystals embedded in SiO2 studied by X-ray absorption fine structure
Local structure of Ge nanocrystals embedded in SiO2 has been studied by X-ray absorption fine structure on the Ge K-edge. The XANES and EXAFS results indicate that Ge atoms in samples with the Ge concentration x=25-40 mol. % are coordinated with oxygen atoms, while they exist as amorphous Ge cluster...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 8(2001), Pt 2 vom: 01. März, Seite 511-3 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2001
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |