Determining crystalline atomic positions using XAFS, a new addition to the UWXAFS analysis package
XAFS and x-ray diffraction (XRD) are complementary structure determination techniques. The combination of XAFS and XRD can be used to determine the complete crystal structure when diffraction can not be refined. This is often the case at high pressures or high temperatures where there is limited acc...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 8(2001), Pt 2 vom: 01. März, Seite 311-3 |
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| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article |
| Langue: | English |
| Publié: |
2001
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. Research Support, U.S. Gov't, P.H.S. |