A new X-ray spectrometer for high-resolution Compton profile measurements at SPring-8
An X-ray spectrometer for high-resolution Compton profile measurements using 90-120 keV X-rays has been designed and constructed at SPring-8. A Cauchois-type triply layered bent-crystal analyzer was employed for the energy analysis. A novel use of a solid-state detector with a large active area was...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 8(2001), 1 vom: 01. Jan., Seite 26-32 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2001
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |