Improving Adversarial Training from the Perspective of Class-Flipping Distribution

par Zhou, Dawei
Publié dans: IEEE transactions on pattern analysis and machine intelligence (2025)

Inspector for Face Forgery Detection Defending Against Adversarial Attacks From Coarse to Fine

par Xia, Ruiyang
Publié dans: IEEE transactions on image processing : a publication of the IEEE Signal Processing Society (2024)

Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium

par Liu, Chao
Publié dans: Advanced materials (Deerfield Beach, Fla.) (2024)