Characterization of pore structure in a nanoporous low-dielectric-constant thin film by neutron porosimetry and X-ray porosimetry

von Hedden, Ronald C
Veröffentlicht in: Langmuir : the ACS journal of surfaces and colloids (2004)

Moisture absorption and absorption kinetics in polyelectrolyte films influence of film thickness

von Vogt, Bryan D
Veröffentlicht in: Langmuir : the ACS journal of surfaces and colloids (2004)

Characterization of nanoporous low-k thin films by small-angle neutron scattering contrast variation

von Hedden, Ronald C
Veröffentlicht in: Langmuir : the ACS journal of surfaces and colloids (2004)