Han, Y., Koo, R., Song, J., Kim, C., Lee, E. K., Shin, W., & Yoo, H. (2025). Heterojunction-Driven Stochasticity: Bi-Heterojunction Noise-Enhanced Negative Transconductance Transistor in Image Generation. Advanced materials (Deerfield Beach, Fla.), 37(41), . https://doi.org/10.1002/adma.202505150
Style de citation ChicagoHan, Youngmin, Ryun-Han Koo, Jaechan Song, Chang-Hyun Kim, Eun Kwang Lee, Wonjun Shin, et Hocheon Yoo. "Heterojunction-Driven Stochasticity: Bi-Heterojunction Noise-Enhanced Negative Transconductance Transistor in Image Generation." Advanced Materials (Deerfield Beach, Fla.) 37, no. 41 (2025). https://dx.doi.org/10.1002/adma.202505150.
Style de citation MLAHan, Youngmin, et al. "Heterojunction-Driven Stochasticity: Bi-Heterojunction Noise-Enhanced Negative Transconductance Transistor in Image Generation." Advanced Materials (Deerfield Beach, Fla.), vol. 37, no. 41, 2025.