Stacked Scintillators Based Multispectral X-Ray Imaging Featuring Quantum-Cutting Perovskite Scintillators With 570 nm Absorption-Emission Shift

Bibliographische Detailangaben
Veröffentlicht in:	Advanced materials (Deerfield Beach, Fla.). - 1998. - 37(2025), 10 vom: 03. März, Seite e2416360
1. Verfasser:	Hui, Juan (VerfasserIn)
Weitere Verfasser:	Ran, Peng, Su, Yirong, Yang, Lurong, Xu, Xuehui, Liu, Tianyu, Gu, Yuzhang, She, Xiaojian, Yang, Yang Michael
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2025
Zugriff auf das übergeordnete Werk:	Advanced materials (Deerfield Beach, Fla.)
Schlagworte:	Journal Article absorption difference material identification multispectral X‐ray imaging mutual excitation quantum‐cutting stacked scintillators

Beschreibung
Zusammenfassung:	© 2025 Wiley‐VCH GmbH. Traditional energy-integration X-ray imaging systems rely on total X-ray intensity for image contrast, ignoring energy-specific information. Recently developed multilayer stacked scintillators have enabled multispectral, large-area flat-panel X-ray imaging (FPXI), enhancing material discrimination capabilities. However, increased layering can lead to mutual excitation, which may affect the accurate discrimination of X-ray energy. This issue is tackled by proposing a novel design strategy utilizing rare earth ions doped quantum-cutting scintillators as the top layer. These scintillators create new luminescence centers via energy transfer, resulting in a significantly larger absorption-emission shift, as well as the potential to double the photoluminescence quantum yield (PLQY) and enhance light output. To verify this concept, a three-layer stacked scintillator detector is developed using ytterbium ions (Yb3+)-doped CsPbCl3 perovskite nanocrystals (PeNCs) as the top layer, which offers a high PLQY of over 100% and a significant absorption-emission shift of 570 nm. This configuration, CsAgCl2 and Cs3Cu2I5 as the middle and bottom layers, respectively, ensures non-overlapping optical absorption and radioluminescence (RL) emission spectra. By calculating the optimal thickness for each layer to absorb specific X-ray energies, the detector demonstrates distinct absorption differences across various energy bands, enhancing the identification of materials with similar densities
Beschreibung:	Date Revised 12.03.2025 published: Print-Electronic Citation Status PubMed-not-MEDLINE
ISSN:	1521-4095
DOI:	10.1002/adma.202416360