APA Zitierstil

Hu, M., Yin, W., Zhang, C., Cai, Z., Long, X., Chen, H., . . . Shen, S. (2024). Metric3D v2: A Versatile Monocular Geometric Foundation Model for Zero-Shot Metric Depth and Surface Normal Estimation. IEEE transactions on pattern analysis and machine intelligence, 46(12), 10579. https://doi.org/10.1109/TPAMI.2024.3444912

Chicago Zitierstil

Hu, Mu, et al. "Metric3D V2: A Versatile Monocular Geometric Foundation Model for Zero-Shot Metric Depth and Surface Normal Estimation." IEEE Transactions on Pattern Analysis and Machine Intelligence 46, no. 12 (2024): 10579. https://dx.doi.org/10.1109/TPAMI.2024.3444912.

MLA Zitierstil

Hu, Mu, et al. "Metric3D V2: A Versatile Monocular Geometric Foundation Model for Zero-Shot Metric Depth and Surface Normal Estimation." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 46, no. 12, 2024, p. 10579.