Style de citation APA

Xu, S., Wang, J., Wu, H., Zhao, Q., Li, G., Fu, S., . . . Hu, C. (2024). Quantifying Dielectric Material Charge Trapping and De-Trapping Ability Via Ultra-Fast Charge Self-Injection Technique. Advanced materials (Deerfield Beach, Fla.), 36(19), . https://doi.org/10.1002/adma.202312148

Style de citation Chicago

Xu, Shuyan, et al. "Quantifying Dielectric Material Charge Trapping and De-Trapping Ability Via Ultra-Fast Charge Self-Injection Technique." Advanced Materials (Deerfield Beach, Fla.) 36, no. 19 (2024). https://dx.doi.org/10.1002/adma.202312148.

Style de citation MLA

Xu, Shuyan, et al. "Quantifying Dielectric Material Charge Trapping and De-Trapping Ability Via Ultra-Fast Charge Self-Injection Technique." Advanced Materials (Deerfield Beach, Fla.), vol. 36, no. 19, 2024.