Quantifying Nanoparticle Layer Topography : Theoretical Modeling and Atomic Force Microscopy Investigations
A comprehensive method consisting of theoretical modeling and experimental atomic force microscopy (AFM) measurements was developed for the quantitative analysis of nanoparticle layer topography. Analytical results were derived for particles of various shapes such as cylinders (rods), disks, ellipso...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 39(2023), 42 vom: 24. Okt., Seite 15067-15077 |
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| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2023
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |
| Accès en ligne |
Volltext |