Deng, J., Miceli, A., & Jacobsen, C. (2023). Counting on the future: Fast charge-integrating detectors for X-ray nanoimaging. Journal of synchrotron radiation, 30(Pt 5), 859. https://doi.org/10.1107/S1600577523007269
Style de citation ChicagoDeng, Junjing, Antonino Miceli, et Chris Jacobsen. "Counting on the Future: Fast Charge-integrating Detectors for X-ray Nanoimaging." Journal of Synchrotron Radiation 30, no. Pt 5 (2023): 859. https://dx.doi.org/10.1107/S1600577523007269.
Style de citation MLADeng, Junjing, et al. "Counting on the Future: Fast Charge-integrating Detectors for X-ray Nanoimaging." Journal of Synchrotron Radiation, vol. 30, no. Pt 5, 2023, p. 859.
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