Du, Y., Sun, H., Zhen, X., Xu, J., Yin, Y., Shao, L., & Snoek, C. G. M. (2024). MetaKernel: Learning Variational Random Features With Limited Labels. IEEE transactions on pattern analysis and machine intelligence, 46(3), 1464. https://doi.org/10.1109/TPAMI.2022.3154930
Chicago ZitierstilDu, Yingjun, Haoliang Sun, Xiantong Zhen, Jun Xu, Yilong Yin, Ling Shao, und Cees G M. Snoek. "MetaKernel: Learning Variational Random Features With Limited Labels." IEEE Transactions on Pattern Analysis and Machine Intelligence 46, no. 3 (2024): 1464. https://dx.doi.org/10.1109/TPAMI.2022.3154930.
MLA ZitierstilDu, Yingjun, et al. "MetaKernel: Learning Variational Random Features With Limited Labels." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 46, no. 3, 2024, p. 1464.