Bellisario, A., Maia, F. R. N. C., & Ekeberg, T. (2022). Noise reduction and mask removal neural network for X-ray single-particle imaging. Journal of applied crystallography, 55(Pt 1), 122. https://doi.org/10.1107/S1600576721012371
Chicago ZitierstilBellisario, Alfredo, Filipe R N C. Maia, und Tomas Ekeberg. "Noise Reduction and Mask Removal Neural Network for X-ray Single-particle Imaging." Journal of Applied Crystallography 55, no. Pt 1 (2022): 122. https://dx.doi.org/10.1107/S1600576721012371.
MLA ZitierstilBellisario, Alfredo, et al. "Noise Reduction and Mask Removal Neural Network for X-ray Single-particle Imaging." Journal of Applied Crystallography, vol. 55, no. Pt 1, 2022, p. 122.
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