Lutz, C., Hampel, S., Beuermann, S., Turek, T., Kunz, U., Garrevoet, J., . . . Fittschen, U. (2021). Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of concept. Journal of synchrotron radiation, 28(Pt 6), 1865. https://doi.org/10.1107/S160057752100905X
Style de citation ChicagoLutz, Christian, Sven Hampel, Sabine Beuermann, Thomas Turek, Ulrich Kunz, Jan Garrevoet, Gerald Falkenberg, et Ursula Fittschen. "Determination of the Through-plane Profile of Vanadium Species in Hydrated Nafion Studied with Micro X-ray Absorption Near-edge Structure Spectroscopy - Proof of Concept." Journal of Synchrotron Radiation 28, no. Pt 6 (2021): 1865. https://dx.doi.org/10.1107/S160057752100905X.
Style de citation MLALutz, Christian, et al. "Determination of the Through-plane Profile of Vanadium Species in Hydrated Nafion Studied with Micro X-ray Absorption Near-edge Structure Spectroscopy - Proof of Concept." Journal of Synchrotron Radiation, vol. 28, no. Pt 6, 2021, p. 1865.