Style de citation APA

Chen, G., Han, K., Shi, B., Matsushita, Y., & Wong, K. K. (2022). Deep Photometric Stereo for Non-Lambertian Surfaces. IEEE transactions on pattern analysis and machine intelligence, 44(1), 129. https://doi.org/10.1109/TPAMI.2020.3005397

Style de citation Chicago

Chen, Guanying, Kai Han, Boxin Shi, Yasuyuki Matsushita, et Kwan-Yee K. Wong. "Deep Photometric Stereo for Non-Lambertian Surfaces." IEEE Transactions on Pattern Analysis and Machine Intelligence 44, no. 1 (2022): 129. https://dx.doi.org/10.1109/TPAMI.2020.3005397.

Style de citation MLA

Chen, Guanying, et al. "Deep Photometric Stereo for Non-Lambertian Surfaces." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 44, no. 1, 2022, p. 129.