APA Zitierstil

Weigel, T., Funke, C., Zschornak, M., Behm, T., Stöcker, H., Leisegang, T., & Meyer, D. C. (2020). X-ray diffraction using focused-ion-beam-prepared single crystals. Journal of applied crystallography, 53(Pt 3), 614. https://doi.org/10.1107/S1600576720003143

Chicago Zitierstil

Weigel, Tina, Claudia Funke, Matthias Zschornak, Thomas Behm, Hartmut Stöcker, Tilmann Leisegang, und Dirk C. Meyer. "X-ray Diffraction Using Focused-ion-beam-prepared Single Crystals." Journal of Applied Crystallography 53, no. Pt 3 (2020): 614. https://dx.doi.org/10.1107/S1600576720003143.

MLA Zitierstil

Weigel, Tina, et al. "X-ray Diffraction Using Focused-ion-beam-prepared Single Crystals." Journal of Applied Crystallography, vol. 53, no. Pt 3, 2020, p. 614.