Ren, Y., Yu, P., Wang, Y., Hou, W., Yang, X., Fan, J., . . . Chen, F. (2020). Development of a Rapid Approach for Detecting Sharp Eyespot Resistance in Seedling-Stage Wheat and Its Application in Chinese Wheat Cultivars. Plant disease, 104(6), 1662. https://doi.org/10.1094/PDIS-12-19-2718-RE
Style de citation ChicagoRen, Yan, et al. "Development of a Rapid Approach for Detecting Sharp Eyespot Resistance in Seedling-Stage Wheat and Its Application in Chinese Wheat Cultivars." Plant Disease 104, no. 6 (2020): 1662. https://dx.doi.org/10.1094/PDIS-12-19-2718-RE.
Style de citation MLARen, Yan, et al. "Development of a Rapid Approach for Detecting Sharp Eyespot Resistance in Seedling-Stage Wheat and Its Application in Chinese Wheat Cultivars." Plant Disease, vol. 104, no. 6, 2020, p. 1662.