Style de citation APA

van Silfhout, R., Pothin, D., & Martin, T. (2020). White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window. Journal of synchrotron radiation, 27(Pt 1), 37. https://doi.org/10.1107/S1600577519015340

Style de citation Chicago

van Silfhout, Roelof, Daniel Pothin, et Thierry Martin. "White Beam Diagnostics Using X-ray Back-scattering from a CVD Diamond Vacuum Window." Journal of Synchrotron Radiation 27, no. Pt 1 (2020): 37. https://dx.doi.org/10.1107/S1600577519015340.

Style de citation MLA

van Silfhout, Roelof, et al. "White Beam Diagnostics Using X-ray Back-scattering from a CVD Diamond Vacuum Window." Journal of Synchrotron Radiation, vol. 27, no. Pt 1, 2020, p. 37.