APA Zitierstil

Isomura, N., Takahashi, N., Kosaka, S., & Kawaura, H. (2019). Thickness of carbon coatings on silicon materials determined by hard X-ray photoelectron spectroscopy at multiple photon energies. Journal of synchrotron radiation, 26(Pt 6), 1936. https://doi.org/10.1107/S1600577519010981

Chicago Zitierstil

Isomura, Noritake, Naoko Takahashi, Satoru Kosaka, und Hiroyuki Kawaura. "Thickness of Carbon Coatings on Silicon Materials Determined by Hard X-ray Photoelectron Spectroscopy at Multiple Photon Energies." Journal of Synchrotron Radiation 26, no. Pt 6 (2019): 1936. https://dx.doi.org/10.1107/S1600577519010981.

MLA Zitierstil

Isomura, Noritake, et al. "Thickness of Carbon Coatings on Silicon Materials Determined by Hard X-ray Photoelectron Spectroscopy at Multiple Photon Energies." Journal of Synchrotron Radiation, vol. 26, no. Pt 6, 2019, p. 1936.