Yang, H., Zhu, D. Z., Zhang, Y., & Zhou, Y. (2019). Numerical investigation on bottom shear stress induced by flushing gate for sewer cleaning. Water science and technology : a journal of the International Association on Water Pollution Research, 80(2), 290. https://doi.org/10.2166/wst.2019.269
Style de citation ChicagoYang, Haoming, David Z. Zhu, Yiping Zhang, et Yongchao Zhou. "Numerical Investigation on Bottom Shear Stress Induced by Flushing Gate for Sewer Cleaning." Water Science and Technology : A Journal of the International Association on Water Pollution Research 80, no. 2 (2019): 290. https://dx.doi.org/10.2166/wst.2019.269.
Style de citation MLAYang, Haoming, et al. "Numerical Investigation on Bottom Shear Stress Induced by Flushing Gate for Sewer Cleaning." Water Science and Technology : A Journal of the International Association on Water Pollution Research, vol. 80, no. 2, 2019, p. 290.