Detailed crystallographic information provided by X-ray diffraction (XRD) is complementary to molecular information provided by Raman spectroscopy. Accordingly, the combined use of these techniques allows the identification of an unknown compound without ambiguity. However, a full combination of Ram...
Détails bibliographiques
| Publié dans: | Journal of applied crystallography. - 1998. - 52(2019), Pt 3 vom: 01. Juni, Seite 618-625
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| Auteur principal: |
El Mendili, Yassine
(Auteur) |
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| Autres auteurs: |
Vaitkus, Antanas,
Merkys, Andrius,
Gražulis, Saulius,
Chateigner, Daniel,
Mathevet, Fabrice,
Gascoin, Stéphanie,
Petit, Sebastien,
Bardeau, Jean-François,
Zanatta, Marco,
Secchi, Maria,
Mariotto, Gino,
Kumar, Arun,
Cassetta, Michele,
Lutterotti, Luca,
Borovin, Evgeny,
Orberger, Beate,
Simon, Patrick,
Hehlen, Bernard,
Le Guen, Monique |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2019
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| Accès à la collection: | Journal of applied crystallography
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| Sujets: | Journal Article
CIF2
DDLm dictionary
Raman spectroscopy
combined Raman–X-ray diffraction
open databases |
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