Park, H. W., Roh, J., Lee, Y. B., & Hwang, C. S. (2019). Modeling of Negative Capacitance in Ferroelectric Thin Films. Advanced materials (Deerfield Beach, Fla.), 31(32), . https://doi.org/10.1002/adma.201805266
Style de citation ChicagoPark, Hyeon Woo, Jangho Roh, Yong Bin Lee, et Cheol Seong Hwang. "Modeling of Negative Capacitance in Ferroelectric Thin Films." Advanced Materials (Deerfield Beach, Fla.) 31, no. 32 (2019). https://dx.doi.org/10.1002/adma.201805266.
Style de citation MLAPark, Hyeon Woo, et al. "Modeling of Negative Capacitance in Ferroelectric Thin Films." Advanced Materials (Deerfield Beach, Fla.), vol. 31, no. 32, 2019.
Attention : ces citations peuvent ne pas être correctes à 100%.