Odstrcil, M., Lebugle, M., Lachat, T., Raabe, J., & Holler, M. (2019). Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics. Journal of synchrotron radiation, 26(Pt 2), 504. https://doi.org/10.1107/S160057751801785X
Chicago ZitierstilOdstrcil, Michal, Maxime Lebugle, Thierry Lachat, Jörg Raabe, und Mirko Holler. "Fast Positioning for X-ray Scanning Microscopy by a Combined Motion of Sample and Beam-defining Optics." Journal of Synchrotron Radiation 26, no. Pt 2 (2019): 504. https://dx.doi.org/10.1107/S160057751801785X.
MLA ZitierstilOdstrcil, Michal, et al. "Fast Positioning for X-ray Scanning Microscopy by a Combined Motion of Sample and Beam-defining Optics." Journal of Synchrotron Radiation, vol. 26, no. Pt 2, 2019, p. 504.