APA Zitierstil

Liu, Y., Cheng, M., Hu, X., Bian, J., Zhang, L., Bai, X., & Tang, J. (2019). Richer Convolutional Features for Edge Detection. IEEE transactions on pattern analysis and machine intelligence, 41(8), 1939. https://doi.org/10.1109/TPAMI.2018.2878849

Chicago Zitierstil

Liu, Yun, Ming-Ming Cheng, Xiaowei Hu, Jia-Wang Bian, Le Zhang, Xiang Bai, und Jinhui Tang. "Richer Convolutional Features for Edge Detection." IEEE Transactions on Pattern Analysis and Machine Intelligence 41, no. 8 (2019): 1939. https://dx.doi.org/10.1109/TPAMI.2018.2878849.

MLA Zitierstil

Liu, Yun, et al. "Richer Convolutional Features for Edge Detection." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 41, no. 8, 2019, p. 1939.