Wang, S., Ding, Z., & Fu, Y. (2019). Cross-Generation Kinship Verification with Sparse Discriminative Metric. IEEE transactions on pattern analysis and machine intelligence, 41(11), 2783. https://doi.org/10.1109/TPAMI.2018.2861871
Style de citation ChicagoWang, Shuyang, Zhengming Ding, et Yun Fu. "Cross-Generation Kinship Verification with Sparse Discriminative Metric." IEEE Transactions on Pattern Analysis and Machine Intelligence 41, no. 11 (2019): 2783. https://dx.doi.org/10.1109/TPAMI.2018.2861871.
Style de citation MLAWang, Shuyang, et al. "Cross-Generation Kinship Verification with Sparse Discriminative Metric." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 41, no. 11, 2019, p. 2783.
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