Jeon, H., Park, J., Choe, G., Park, J., Bok, Y., Tai, Y., & Kweon, I. S. (2019). Depth from a Light Field Image with Learning-Based Matching Costs. IEEE transactions on pattern analysis and machine intelligence, 41(2), 297. https://doi.org/10.1109/TPAMI.2018.2794979
Style de citation ChicagoJeon, Hae-Gon, Jaesik Park, Gyeongmin Choe, Jinsun Park, Yunsu Bok, Yu-Wing Tai, et In So Kweon. "Depth from a Light Field Image with Learning-Based Matching Costs." IEEE Transactions on Pattern Analysis and Machine Intelligence 41, no. 2 (2019): 297. https://dx.doi.org/10.1109/TPAMI.2018.2794979.
Style de citation MLAJeon, Hae-Gon, et al. "Depth from a Light Field Image with Learning-Based Matching Costs." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 41, no. 2, 2019, p. 297.