Li, R., Li, Z., Pambou, E., Gutfreund, P., Waigh, T. A., Webster, J. R. P., & Lu, J. R. (2018). Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy. Langmuir : the ACS journal of surfaces and colloids, 34(5), 1827. https://doi.org/10.1021/acs.langmuir.7b03117
Style de citation ChicagoLi, Ruiheng, Zongyi Li, Elias Pambou, Philipp Gutfreund, Thomas A. Waigh, John R P. Webster, et Jian R. Lu. "Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy." Langmuir : The ACS Journal of Surfaces and Colloids 34, no. 5 (2018): 1827. https://dx.doi.org/10.1021/acs.langmuir.7b03117.
Style de citation MLALi, Ruiheng, et al. "Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 34, no. 5, 2018, p. 1827.