As the quest toward novel materials proceeds, improved characterization technologies are needed. In particular, the atomic thickness in graphene and other 2D materials renders some conventional technologies obsolete. Characterization technologies at wafer level are needed with enough sensitivity to...
Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 34(2018), 4 vom: 30. Jan., Seite 1783-1794
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| Auteur principal: |
Rojas, W Y
(Auteur) |
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| Autres auteurs: |
Winter, A D,
Grote, J,
Kim, S S,
Naik, R R,
Williams, A D,
Weiland, C,
Principe, E,
Fischer, D A,
Banerjee, S,
Prendergast, D,
Campo, E M |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2018
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S. |
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