Nanocrystallography measurements of early stage synthetic malaria pigment

The recent availability of extremely intense, femtosecond X-ray free-electron laser (XFEL) sources has spurred the development of serial femtosecond nanocrystallography (SFX). Here, SFX is used to analyze nanoscale crystals of β-hematin, the synthetic form of hemozoin which is a waste by-product of...

Description complète

Détails bibliographiques
Publié dans:Journal of applied crystallography. - 1998. - 50(2017), Pt 5 vom: 01. Okt., Seite 1533-1540
Auteur principal: Dilanian, Ruben A (Auteur)
Autres auteurs: Streltsov, Victor, Coughlan, Hannah D, Quiney, Harry M, Martin, Andrew V, Klonis, Nectarios, Dogovski, Con, Boutet, Sébastien, Messerschmidt, Marc, Williams, Garth J, Williams, Sophie, Phillips, Nicholas W, Nugent, Keith A, Tilley, Leann, Abbey, Brian
Format: Article en ligne
Langue:English
Publié: 2017
Accès à la collection:Journal of applied crystallography
Sujets:Journal Article crystalline disorder crystallography malaria serial femtosecond nanocrystallography structural inhomogeniety