Schultz, S. R., Copeland, C. S., Foust, A. J., Quicke, P., & Schuck, R. (2017). Advances in two photon scanning and scanless microscopy technologies for functional neural circuit imaging. Proceedings of the IEEE. Institute of Electrical and Electronics Engineers, 105(1), 139. https://doi.org/10.1109/JPROC.2016.2577380
Style de citation ChicagoSchultz, Simon R., Caroline S. Copeland, Amanda J. Foust, Peter Quicke, et Renaud Schuck. "Advances in Two Photon Scanning and Scanless Microscopy Technologies for Functional Neural Circuit Imaging." Proceedings of the IEEE. Institute of Electrical and Electronics Engineers 105, no. 1 (2017): 139. https://dx.doi.org/10.1109/JPROC.2016.2577380.
Style de citation MLASchultz, Simon R., et al. "Advances in Two Photon Scanning and Scanless Microscopy Technologies for Functional Neural Circuit Imaging." Proceedings of the IEEE. Institute of Electrical and Electronics Engineers, vol. 105, no. 1, 2017, p. 139.