APA Zitierstil

Schultz, S. R., Copeland, C. S., Foust, A. J., Quicke, P., & Schuck, R. (2017). Advances in two photon scanning and scanless microscopy technologies for functional neural circuit imaging. Proceedings of the IEEE. Institute of Electrical and Electronics Engineers, 105(1), 139. https://doi.org/10.1109/JPROC.2016.2577380

Chicago Zitierstil

Schultz, Simon R., Caroline S. Copeland, Amanda J. Foust, Peter Quicke, und Renaud Schuck. "Advances in Two Photon Scanning and Scanless Microscopy Technologies for Functional Neural Circuit Imaging." Proceedings of the IEEE. Institute of Electrical and Electronics Engineers 105, no. 1 (2017): 139. https://dx.doi.org/10.1109/JPROC.2016.2577380.

MLA Zitierstil

Schultz, Simon R., et al. "Advances in Two Photon Scanning and Scanless Microscopy Technologies for Functional Neural Circuit Imaging." Proceedings of the IEEE. Institute of Electrical and Electronics Engineers, vol. 105, no. 1, 2017, p. 139.