Lu, J., Hu, J., & Tan, Y. (2017). Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE transactions on image processing : a publication of the IEEE Signal Processing Society, 26(9), 4269. https://doi.org/10.1109/TIP.2017.2717505
Style de citation ChicagoLu, Jiwen, Junlin Hu, et Yap-Peng Tan. "Discriminative Deep Metric Learning for Face and Kinship Verification." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society 26, no. 9 (2017): 4269. https://dx.doi.org/10.1109/TIP.2017.2717505.
Style de citation MLALu, Jiwen, et al. "Discriminative Deep Metric Learning for Face and Kinship Verification." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society, vol. 26, no. 9, 2017, p. 4269.