Style de citation APA

Kayser, Y., David, C., Flechsig, U., Krempasky, J., Schlott, V., & Abela, R. (2017). X-ray grating interferometer for in situ and at-wavelength wavefront metrology. Journal of synchrotron radiation, 24(Pt 1), 150. https://doi.org/10.1107/S1600577516017562

Style de citation Chicago

Kayser, Yves, Christian David, Uwe Flechsig, Juraj Krempasky, Volker Schlott, et Rafael Abela. "X-ray Grating Interferometer for In situ and At-wavelength Wavefront Metrology." Journal of Synchrotron Radiation 24, no. Pt 1 (2017): 150. https://dx.doi.org/10.1107/S1600577516017562.

Style de citation MLA

Kayser, Yves, et al. "X-ray Grating Interferometer for In situ and At-wavelength Wavefront Metrology." Journal of Synchrotron Radiation, vol. 24, no. Pt 1, 2017, p. 150.