Thinness- and Shape-Controlled Growth for Ultrathin Single-Crystalline Perovskite Wafers for Mass Production of Superior Photoelectronic Devices

Thinness- and Shape-Controlled Growth for Ultrathin Single-Crystalline Perovskite Wafers for Mass Production of Superior Photoelectronic Devices

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Détails bibliographiques
Publié dans:Advanced materials (Deerfield Beach, Fla.). - 1998. - 28(2016), 41 vom: 20. Nov., Seite 9204-9209
Auteur principal: Liu, Yucheng (Auteur)
Autres auteurs: Zhang, Yunxia, Yang, Zhou, Yang, Dong, Ren, Xiaodong, Pang, Liuqing, Liu, Shengzhong Frank
Format: Article en ligne
Langue:English
Publié: 2016
Accès à la collection:Advanced materials (Deerfield Beach, Fla.)
Sujets:Journal Article controlled growth perovskites photodetectors ultrathin wafers
Description
Résumé:© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Thinness-controlled perovskite wafers are directly prepared using a geometry-regulated dynamic-flow reaction system. It is found that the wafers are a superior material for photodetectors with a photocurrent response ≈350 times higher than that made of microcrystalline thin films. Moreover, the wafers are compatible with mass production of integrated circuits
Description:Date Completed 17.07.2018
Date Revised 30.09.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201601995