Immobilized Particle Imaging for Quantification of Nano- and Microparticles
The quantification of nano- and microparticles is critical for diverse applications relying on the exact knowledge of the particle concentration. Although many techniques are available for counting particles, there are some limitations in regards to counting with low-scattering materials and facile...
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Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 32(2016), 14 vom: 12. Apr., Seite 3532-40
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| Auteur principal: |
Cui, Jiwei
(Auteur) |
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| Autres auteurs: |
Hibbs, Benjamin,
Gunawan, Sylvia T,
Braunger, Julia A,
Chen, Xi,
Richardson, Joseph J,
Hanssen, Eric,
Caruso, Frank |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2016
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article
Research Support, Non-U.S. Gov't |
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