Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing
A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles...
| Publié dans: | Journal of applied crystallography. - 1998. - 49(2016), Pt 1 vom: 01. Feb., Seite 47-54 |
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| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article |
| Langue: | English |
| Publié: |
2016
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article instrumental smearing effects pinhole collimation small-angle X-ray scattering |