Blanchard, P., Sun, T., Yu, Y., Wei, Z., Matsui, H., & Mirkin, M. V. (2016). Scanning Electrochemical Microscopy Study of Permeability of a Thiolated Aryl Multilayer and Imaging of Single Nanocubes Anchored to It. Langmuir : the ACS journal of surfaces and colloids, 32(10), 2500. https://doi.org/10.1021/acs.langmuir.5b03858
Style de citation ChicagoBlanchard, Pierre-Yves, Tong Sun, Yun Yu, Zengyan Wei, Hiroshi Matsui, et Michael V. Mirkin. "Scanning Electrochemical Microscopy Study of Permeability of a Thiolated Aryl Multilayer and Imaging of Single Nanocubes Anchored to It." Langmuir : The ACS Journal of Surfaces and Colloids 32, no. 10 (2016): 2500. https://dx.doi.org/10.1021/acs.langmuir.5b03858.
Style de citation MLABlanchard, Pierre-Yves, et al. "Scanning Electrochemical Microscopy Study of Permeability of a Thiolated Aryl Multilayer and Imaging of Single Nanocubes Anchored to It." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 32, no. 10, 2016, p. 2500.