Qin, C., Matsushima, T., Fujihara, T., Potscavage, W. J. J., & Adachi, C. (2016). Degradation Mechanisms of Solution-Processed Planar Perovskite Solar Cells: Thermally Stimulated Current Measurement for Analysis of Carrier Traps. Advanced materials (Deerfield Beach, Fla.), 28(3), 466. https://doi.org/10.1002/adma.201502610
Style de citation ChicagoQin, Chuanjiang, Toshinori Matsushima, Takashi Fujihara, William J Jr Potscavage, et Chihaya Adachi. "Degradation Mechanisms of Solution-Processed Planar Perovskite Solar Cells: Thermally Stimulated Current Measurement for Analysis of Carrier Traps." Advanced Materials (Deerfield Beach, Fla.) 28, no. 3 (2016): 466. https://dx.doi.org/10.1002/adma.201502610.
Style de citation MLAQin, Chuanjiang, et al. "Degradation Mechanisms of Solution-Processed Planar Perovskite Solar Cells: Thermally Stimulated Current Measurement for Analysis of Carrier Traps." Advanced Materials (Deerfield Beach, Fla.), vol. 28, no. 3, 2016, p. 466.