Shan, X., Chen, S., Wang, H., Chen, Z., Guan, Y., Wang, Y., . . . Tao, N. (2015). Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging. Advanced materials (Deerfield Beach, Fla.), 27(40), 6213. https://doi.org/10.1002/adma.201502822
Chicago ZitierstilShan, Xiaonan, Shan Chen, Hui Wang, Zixuan Chen, Yan Guan, Yixian Wang, Shaopeng Wang, Hong-Yuan Chen, und Nongjian Tao. "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging." Advanced Materials (Deerfield Beach, Fla.) 27, no. 40 (2015): 6213. https://dx.doi.org/10.1002/adma.201502822.
MLA ZitierstilShan, Xiaonan, et al. "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging." Advanced Materials (Deerfield Beach, Fla.), vol. 27, no. 40, 2015, p. 6213.