Shan, X., Chen, S., Wang, H., Chen, Z., Guan, Y., Wang, Y., . . . Tao, N. (2015). Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging. Advanced materials (Deerfield Beach, Fla.), 27(40), 6213. https://doi.org/10.1002/adma.201502822
Style de citation ChicagoShan, Xiaonan, Shan Chen, Hui Wang, Zixuan Chen, Yan Guan, Yixian Wang, Shaopeng Wang, Hong-Yuan Chen, et Nongjian Tao. "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging." Advanced Materials (Deerfield Beach, Fla.) 27, no. 40 (2015): 6213. https://dx.doi.org/10.1002/adma.201502822.
Style de citation MLAShan, Xiaonan, et al. "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging." Advanced Materials (Deerfield Beach, Fla.), vol. 27, no. 40, 2015, p. 6213.