APA Zitierstil

Benediktovitch, A., Zhylik, A., Ulyanenkova, T., Myronov, M., & Ulyanenkov, A. (2015). Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction. Journal of applied crystallography, 48(Pt 3), 655.

Chicago Zitierstil

Benediktovitch, Andrei, Alexei Zhylik, Tatjana Ulyanenkova, Maksym Myronov, und Alex Ulyanenkov. "Characterization of Dislocations in Germanium Layers Grown on (011)- and (111)-oriented Silicon by Coplanar and Noncoplanar X-ray Diffraction." Journal of Applied Crystallography 48, no. Pt 3 (2015): 655.

MLA Zitierstil

Benediktovitch, Andrei, et al. "Characterization of Dislocations in Germanium Layers Grown on (011)- and (111)-oriented Silicon by Coplanar and Noncoplanar X-ray Diffraction." Journal of Applied Crystallography, vol. 48, no. Pt 3, 2015, p. 655.