Style de citation APA

Benediktovitch, A., Zhylik, A., Ulyanenkova, T., Myronov, M., & Ulyanenkov, A. (2015). Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction. Journal of applied crystallography, 48(Pt 3), 655.

Style de citation Chicago

Benediktovitch, Andrei, Alexei Zhylik, Tatjana Ulyanenkova, Maksym Myronov, et Alex Ulyanenkov. "Characterization of Dislocations in Germanium Layers Grown on (011)- and (111)-oriented Silicon by Coplanar and Noncoplanar X-ray Diffraction." Journal of Applied Crystallography 48, no. Pt 3 (2015): 655.

Style de citation MLA

Benediktovitch, Andrei, et al. "Characterization of Dislocations in Germanium Layers Grown on (011)- and (111)-oriented Silicon by Coplanar and Noncoplanar X-ray Diffraction." Journal of Applied Crystallography, vol. 48, no. Pt 3, 2015, p. 655.