Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns : a numerical study

Crystal defects induce strong distortions in diffraction patterns. A single defect alone can yield strong and fine features that are observed in high-resolution diffraction experiments such as coherent X-ray diffraction. The case of face-centred cubic nanocrystals is studied numerically and the sign...

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Veröffentlicht in:Journal of applied crystallography. - 1998. - 48(2015), Pt 3 vom: 01. Juni, Seite 621-644
1. Verfasser: Dupraz, Maxime (VerfasserIn)
Weitere Verfasser: Beutier, Guillaume, Rodney, David, Mordehai, Dan, Verdier, Marc
Format: Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article coherent X-ray diffraction dislocations face-centred cubic nanocrystals stacking faults