Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns : a numerical study
Crystal defects induce strong distortions in diffraction patterns. A single defect alone can yield strong and fine features that are observed in high-resolution diffraction experiments such as coherent X-ray diffraction. The case of face-centred cubic nanocrystals is studied numerically and the sign...
Veröffentlicht in: | Journal of applied crystallography. - 1998. - 48(2015), Pt 3 vom: 01. Juni, Seite 621-644 |
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Weitere Verfasser: | , , , |
Format: | Aufsatz |
Sprache: | English |
Veröffentlicht: |
2015
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Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
Schlagworte: | Journal Article coherent X-ray diffraction dislocations face-centred cubic nanocrystals stacking faults |